Making Accurate Low-Level Measurements Course
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Duration: 2 days
Dates: Feb 13 - 14, 2007, Irvine, CA
Jun 19 - 20, 2007, Cleveland, OH
List Price: $990
Part Number: TRN-LLM-1-K
Included: Certificate of completion, Comprehensive Workbook, Coffee (AM), Lunch, Soft Drinks (PM)
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Audience:
Engineers and scientists who need to make low-level electrical measurements.
Summary:
This course provides users with a detailed understanding of how to make accurate low-level electrical measurements. Users will learn what constitutes a low-level measurement, the limitations of these measurements, sources of measurement error, and techniques to eliminate these errors. Additional topics include selecting the proper product for a desired measurement and understanding the basics of how to communicate with an instrument from a PC. The session consists of lectures, demonstrations, and hands-on labs.
Prerequisites:
None.
After Attending This Class, You Will Be Able To:
- Identify fundamental limitations of basic electrical measurements
- Understand and recognize common sources of measurement error
- Implement techniques to minimize the effect of measurement errors
- Select the best instrument for a desired measurement
- Apply low-level measurement methods to your specific application
Benefits You Will Receive:
- Avoid costly delays by recognizing common measurement problems
- Avoid measurement errors by learning how to use various measurement techniques
- Increase productivity by selecting the proper instrument for a specific application
- Optimize your testing by understanding the speed vs. noise tradeoff
Outline (Agenda):
- Introduction to low-level measurements
- Common challenges of basic electrical measurements and measurement techniques to address them
- Voltage measurements
- Current measurements
- Resistance measurements
- Selecting the appropriate instrument for a desired measurement
- Measuring multiple devices or using multiple test instruments
- Converting environmental measurements to electrical measurements
- Introducing remote control of instruments from a PC
- Measurement examples for nano-science applications: how the discussed measurement methods and techniques have been implemented in practice
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Additional course information and policies
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Zuletzt verändert: 2007-01-03